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International Symposium for Testing and Failure Analysis


Venue:	McEnery Convention Center
Country:	San Jose, United States
Address:	150 West San Carlos Street, San Jose, California, San Jose
Date:	15-11-2011 16-11-2011
Category:	Computer & IT

Description:

International Symposium for Testing and Failure Analysis is an important event in the field of micro electronics failure analysis. The technological industry largely depends upon semiconductors, the microchips that power and control computers, automobiles, telephones and other devices and this show provides the best platform for professionals from the complete community of analysts and scientists to come together and exchange ideas.

Profile:

Visitors: Technical symposia, user group discussions, seminars and short courses form the event highlights

Exhibitors: Scientists, engineers and engineering forms, research institutes, delegates from different countries willing to explore latest development all over, venture capitalists who would be looking forward to funding promising projects and entrepreneurs.